Equipment
Atomic force microscope
Image: MfM/ FSU
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Processing of thin Layers
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- Spin-Coater - Laurell-WS-400B-6NPP-LITE
- Dip-Coater (Prototype)
- Environmental Chamber - BINDER KBF 240a
- Vacuum drying oven - Shel Lab SVAC 1-2
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Surface Characterization
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- Atomic Force Microscope - AFM - Nano Wizard 4
- Profilometer - Form Talysurf Laser Series 2 - AMETEK Taylor Hobson
- White Light Interference Microscope Talysurf CCI HD - AMETEK Taylor Hobson
- 3D CNC Multisensor Coordinate Measuring Machine - Scopecheck 200 - Werth Messtechnik
- Laser Position Sensor - Keyence LK-G10
- Confocal Digital Microscope - Keyence VHX
- Polarizing Microscope - JENAPOL - Carl Zeiss Jena
- Stereo Mikroskope - MOTIC DMO 456
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Mechanical Characterization
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Sample Preparation
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- Grinding and Polishing Machine - EcoMet 300 with AutoMet 300 - Buehler GmbH
- Lever Polishing Machine - Naicotech
- Notching Machine - CEAST Notchvis
- Environmental Chamber - BINDER KBF 240a
- Vacuum Drying Oven - Shel Lab SVAC 1-2
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Preprocessing and Precision Machining
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- CNC Ultrasonic Erosion Machine - Erosonic (DAMA)
- CNC Surface and Profile Grinding Machine - Planomat 408 - Blohm
- CNC Cylindrical Grinding Machine - Studer S20
- Diamond Wire Saw - Well
- CNC 5 Axis High Speed Machining Center - ultrasonic 20 linear - Sauer DMG-Mori Seiki
